Scanning Electron Microscopy And X-ray Microanalysis

The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray spectral measurement, x-ray analysis, specimen pre paration, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition.